Focused ion beam (FIB) in situ lift-out (INLO) technique showing

An INLO sample mounted on a TEM grid.

Focused Ion Beam - an overview

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

focused ion-beam milling, FIB, Glossary

Emmanuel PEREZ, Senior Engineer, Materials Science and Engineering, PhD, Savannah River National Laboratory, South Carolina, SRNL

76043-01

Electronics] Automated Micro-sampling (FIB in-situ lift out)

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

Focused Ion Beam Technology - an overview

Emmanuel PEREZ, Senior Engineer, Materials Science and Engineering, PhD, Savannah River National Laboratory, South Carolina, SRNL